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dc.contributor.authorMaaβ, Henriette
dc.contributor.authorBentmann, Hendrik
dc.contributor.authorSeibel, Christoph
dc.contributor.authorTusche, Christian
dc.contributor.authorEremeev, Sergey V.
dc.contributor.authorPeixoto, Thiago R. F.
dc.contributor.authorTereshchenko, Oleg E
dc.contributor.authorKokh, Konstantin A.
dc.contributor.authorTchoulkov Savkin, Evgueni Vladimirovich
dc.contributor.authorKirschner, Jürgen
dc.contributor.authorReinert, Friedrich
dc.date.accessioned2018-03-02T10:01:42Z
dc.date.available2018-03-02T10:01:42Z
dc.date.issued2016-05
dc.identifier.citationNature Communications 7 : (2016) // Article ID 11621es_ES
dc.identifier.issn2041-1723
dc.identifier.urihttp://hdl.handle.net/10810/25408
dc.description.abstractSemiconductors with strong spin-orbit interaction as the underlying mechanism for the generation of spin-polarized electrons are showing potential for applications in spintronic devices. Unveiling the full spin texture in momentum space for such materials and its relation to the microscopic structure of the electronic wave functions is experimentally challenging and yet essential for exploiting spin-orbit effects for spin manipulation. Here we employ a state-of-the-art photoelectron momentum microscope with a multichannel spin filter to directly image the spin texture of the layered polar semiconductor BiTeI within the full two-dimensional momentum plane. Our experimental results, supported by relativistic ab initio calculations, demonstrate that the valence and conduction band electrons in BiTeI have spin textures of opposite chirality and of pronounced orbital dependence beyond the standard Rashba model, the latter giving rise to strong optical selection-rule effects on the photoelectron spin polarization. These observations open avenues for spin-texture manipulation by atomic-layer and charge carrier control in polar semiconductors.es_ES
dc.description.sponsorshipThis work was supported by DFG (through SFB 1170 'ToCoTronics') and through FOR1162 (P3). We acknowledge the support by the Basque Departamento de Educacion, UPV/EHU (Grant Number IT-756-13), Spanish Ministerio de Economia y Competitividad (MINECO Grant Number FIS2013-48286-C2-2-P), Tomsk State University Academic D.I. Mendeleev Fund Program in 2015 (Research Grant Number 8.1.05.2015), the Russian Foundation for Basic Research (Grant Numbers 15-02-01797 and 15-02-589 02717). Partial support by the Saint Petersburg State University (Grant Number 15.61.202.2015) is also acknowledged.es_ES
dc.language.isoenges_ES
dc.publisherNature Publishinges_ES
dc.relationinfo:eu-repo/grantAgreement/MINECO/FIS2013-48286-C2-2-Pes_ES
dc.rightsinfo:eu-repo/semantics/openAccesses_ES
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/es/*
dc.subjecttransition-metal dichalcogenideses_ES
dc.subjectaugmented-wave methodes_ES
dc.subjecttipological insulatorses_ES
dc.subjecteffect transistores_ES
dc.subjectorbital texturees_ES
dc.subjectsurface-stateses_ES
dc.subjectphotoemissiones_ES
dc.subjectfieldes_ES
dc.subjectapproximationes_ES
dc.subjectmanipulationes_ES
dc.titleSpin-texture inversion in the giant Rashba semiconductor BiTeIes_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.rights.holderThis work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/es_ES
dc.rights.holderAtribución 3.0 España*
dc.relation.publisherversionhttps://www.nature.com/articles/ncomms11621es_ES
dc.identifier.doi10.1038/ncomms11621
dc.departamentoesFísica de materialeses_ES
dc.departamentoeuMaterialen fisikaes_ES


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This work is licensed under a Creative Commons Attribution 4.0
International License. The images or other third party material in this
article are included in the article’s Creative Commons license, unless indicated otherwise
in the credit line; if the material is not included under the Creative Commons license,
users will need to obtain permission from the license holder to reproduce the material.
To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
Except where otherwise noted, this item's license is described as This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/