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dc.contributor.authorErcoreca González, Aitor
dc.contributor.authorMartínez Perdiguero, Jesús ORCID
dc.date.accessioned2024-03-27T17:31:20Z
dc.date.available2024-03-27T17:31:20Z
dc.date.issued2024-02-05
dc.identifier.citationReview of Scientific Instruments 95(2) : (2024) // Article ID 023903es_ES
dc.identifier.issn0034-6748
dc.identifier.issn1089-7623
dc.identifier.urihttp://hdl.handle.net/10810/66524
dc.description.abstractA simple and novel setup for high-frequency dielectric spectroscopy of materials has been developed using a portable vector network analyzer. The measurement principle is based on radio-frequency reflectometry, and both its capabilities and limitations are discussed. The results obtained on a typical liquid crystal prove that the device can provide reliable spectra between 107 Hz and 109 Hz, thus extending the capabilities of conventional impedance analyzers.es_ES
dc.description.sponsorshipA.E. and J.M.-P. acknowledge funding from the Basque Government Project IT1458-22. A.E. thanks the Department of Education of the Basque Government for a predoctoral fellowship (Grant No. PRE_2022_1_0104).es_ES
dc.language.isoenges_ES
dc.publisherAIP Publishinges_ES
dc.rightsinfo:eu-repo/semantics/openAccesses_ES
dc.titleDevelopment of a high-frequency dielectric spectrometer using a portable vector network analyzeres_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.rights.holder(c) 2024 AIP Publishinges_ES
dc.relation.publisherversionhttps://pubs.aip.org/aip/rsi/article/95/2/023903/3261745/Development-of-a-high-frequency-dielectrices_ES
dc.identifier.doi10.1063/5.0177065
dc.departamentoesFísica de la materia condensadaes_ES
dc.departamentoeuMateria kondentsatuaren fisikaes_ES


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