dc.contributor.author | Picón Ruiz, Artzai  | |
dc.contributor.author | Álvarez Gila, Aitor | |
dc.contributor.author | Arteche Vicario, José Antonio | |
dc.contributor.author | López, Gabriel Alejandro  | |
dc.contributor.author | Vicente Rojo, Asier | |
dc.date.accessioned | 2021-09-02T10:07:02Z | |
dc.date.available | 2021-09-02T10:07:02Z | |
dc.date.issued | 2021-07-12 | |
dc.identifier.citation | IEEE Access 9 : 100513 - 100529 (2021) | es_ES |
dc.identifier.issn | 2169-3536 | |
dc.identifier.uri | http://hdl.handle.net/10810/52895 | |
dc.description.abstract | [EN] Estimating the temperature of hot emissive samples (e.g. liquid slag) in the context of harsh
industrial environments such as steelmaking plants is a crucial yet challenging task, which is typically
addressed by means of methods that require physical contact. Current remote methods require information
on the emissivity of the sample. However, the spectral emissivity is dependent on the sample composition
and temperature itself, and it is hardly measurable unless under controlled laboratory procedures. In this
work, we present a portable device and associated probabilistic model that can simultaneously produce
quasi real-time estimates for temperature and spectral emissivity of hot samples in the [0.2, 12.0μm] range
at distances of up to 20m. The model is robust against variable atmospheric conditions, and the device is
presented together with a quick calibration procedure that allows for in field deployment in rough industrial
environments, thus enabling in line measurements. We validate the temperature and emissivity estimates by
our device against laboratory equipment under controlled conditions in the [550, 850◦C] temperature range
for two solid samples with well characterized spectral emissivity’s: alumina (α −Al2O3) and hexagonal
boron nitride (h −BN ). The analysis of the results yields Root Mean Squared Errors of 32.3◦C and 5.7◦C
respectively, and well correlated spectral emissivity’s. | es_ES |
dc.language.iso | eng | es_ES |
dc.publisher | Institute of Electrical and Electronics Engineers | es_ES |
dc.rights | info:eu-repo/semantics/openAccess | es_ES |
dc.rights.uri | http://creativecommons.org/licenses/by/3.0/es/ | * |
dc.subject | probabilistic computing | es_ES |
dc.subject | radiometry | es_ES |
dc.subject | spectral analysis | es_ES |
dc.subject | spectral emissivity | es_ES |
dc.subject | spectroscopy | es_ES |
dc.subject | steel industry | es_ES |
dc.subject | temperature measurement | es_ES |
dc.title | A probabilistic model and capturing device for remote simultaneous estimation of spectral emissivity and temperature of hot emissive materials | es_ES |
dc.type | info:eu-repo/semantics/article | es_ES |
dc.rights.holder | CCBY - IEEE is not the copyright holder of this material. Please follow the instructions via https://creativecommons.org/licenses/by/4.0/ to obtain full-text articles and stipulations in the API documentation. | es_ES |
dc.rights.holder | Atribución 3.0 España | * |
dc.relation.publisherversion | https://ieeexplore.ieee.org/document/9481229 | es_ES |
dc.identifier.doi | 10.1109/ACCESS.2021.3096599 | |
dc.departamentoes | Física | es_ES |
dc.departamentoes | Ingeniería de sistemas y automática | es_ES |
dc.departamentoes | Ingeniería química y del medio ambiente | es_ES |
dc.departamentoeu | Fisika | es_ES |
dc.departamentoeu | Ingeniaritza kimikoa eta ingurumenaren ingeniaritza | es_ES |
dc.departamentoeu | Sistemen ingeniaritza eta automatika | es_ES |