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dc.contributor.authorGutiérrez Ruiz, José Julio ORCID
dc.contributor.authorBeeckman, Pierre
dc.contributor.authorAzcarate Blanco, Izaskun
dc.date.accessioned2024-02-08T09:11:21Z
dc.date.available2024-02-08T09:11:21Z
dc.date.issued2015
dc.identifier.citation23rd International Conference on Electricity Distribution : (2015)
dc.identifier.urihttp://hdl.handle.net/10810/64960
dc.description.abstractThe massive application of new lighting technologies and the phase out of incandescent lamps present an important challenge in terms of flicker. The standardized flicker measurement procedure and the existing compatibility levels were based on the response of the incandescent lamp. In order to test the sensitivity of modern lamps to voltage fluctuations, the working group (MT 1) of IECTC34 has developed an objective immunity test protocol. This work presents the main issues that were critical in the implementation of the immunity test system and the results obtained from a set of lamps selected for a Round Robin Test performed by different entities which also took part on the development of the immunity test protocol.es_ES
dc.language.isoenges_ES
dc.publisherCIRED
dc.rightsinfo:eu-repo/semantics/openAccesses_ES
dc.titleA protocol to test the sensitivity of lighting equipment to voltage fluctuationses_ES
dc.typeinfo:eu-repo/semantics/conferenceObjectes_ES
dc.rights.holder(c) 2015 CIRED*
dc.relation.publisherversionhttp://cired.net/publications/cired2015/
dc.departamentoesIngeniería de comunicacioneses_ES
dc.departamentoesMatemática aplicadaes_ES
dc.departamentoeuKomunikazioen ingeniaritzaes_ES
dc.departamentoeuMatematika aplikatuaes_ES


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