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dc.contributor.authorGutiérrez Ruiz, José Julio ORCID
dc.contributor.authorLeturiondo Arana, Luis Alberto
dc.contributor.authorRuiz Ojeda, Jesús María ORCID
dc.contributor.authorLazkano Bilbao, Andoni
dc.contributor.authorSaiz Agustín, Purificación ORCID
dc.contributor.authorAzcarate Blanco, Izaskun
dc.date.accessioned2024-02-08T10:16:42Z
dc.date.available2024-02-08T10:16:42Z
dc.date.issued2011
dc.identifier.citationIEEE Transactions on Power Delivery 268(4) : 2215 - 2222 (2011)
dc.identifier.issn0885-8977
dc.identifier.urihttp://hdl.handle.net/10810/65226
dc.description.abstractThis paper presents an analysis of the effect of the sampling rate on the calculation by a digital flickermeter of the flicker severity caused by phase jumps. The new edition of the IEC 61000-4-15 standard includes an innovative test aimed at verifying that a flickermeter works properly during a phase jump event. Since phase jumps are rapid angle changes, it seems that a high sampling rate should be used by a digital instrument. This requirement could be too demanding, so we have studied this hypothesis by defining three analytical signal models. One is based on the characterization of ideal phase jump sequences and the other two are based on the definition of realistic band-limited signals containing phase jumps. We found that the minimum sampling rate necessary to pass that test is not as demanding as expected. Practical experiments made by an actual generation and acquisition system confirm this conclusion. A typical sampling rate of 3200 S/s, usually used in commercial flickermeters, becomes clearly sufficient to pass the test. However, we give notice that passing this test could not guarantee accurate results when the phase jumps are different from those specified by the standard.es_ES
dc.language.isoenges_ES
dc.publisherIEEE
dc.rightsinfo:eu-repo/semantics/openAccesses_ES
dc.subjectflickeres_ES
dc.subjectIEC flickermeteres_ES
dc.subjectphase jumpses_ES
dc.subjectpower Qualityes_ES
dc.subjectpstes_ES
dc.titleEffect of the sampling rate on the assessment of flicker severity due to phase jumpses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.rights.holder© 2011 IEEE
dc.relation.publisherversionhttps://ieeexplore.ieee.org/document/5936086
dc.identifier.doi10.1109/TPWRD.2011.2156819
dc.departamentoesIngeniería de comunicacioneses_ES
dc.departamentoesMatemática aplicadaes_ES
dc.departamentoeuKomunikazioen ingeniaritzaes_ES
dc.departamentoeuMatematika aplikatuaes_ES


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