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dc.contributor.authorMatallana Fernandez, Asier ORCID
dc.contributor.authorAndreu Larrañaga, Jon ORCID
dc.contributor.authorGárate Añibarro, José Ignacio
dc.contributor.authorMartínez de Alegría Mancisidor, Iñigo ORCID
dc.contributor.authorKortabarria Iparragirre, Iñigo ORCID
dc.date.accessioned2024-04-29T17:41:44Z
dc.date.available2024-04-29T17:41:44Z
dc.date.issued2017-08-07
dc.identifier.citationIEEE 26th International Symposium on Industrial Electronics (ISIE), Edinburgh, UK, 2017 : 616-621 (2017)es_ES
dc.identifier.isbn978-1-5090-1412-5
dc.identifier.issn2163-5145
dc.identifier.urihttp://hdl.handle.net/10810/66926
dc.description.abstractPower electronic applications need high voltage and current ranges which are impossible to obtain with discrete devices. Parallelization technique is a solution to increase power converter current capacity. Current distribution problems may reduce device lifetime and cause converter malfunction. Parallelization requires a total control of circuit parasitic elements which depend on layout physical materials and dimensions. The objective of this article is to show, by electromagnetic (EM) model simulations, layout non ideal effects for power circuits, in order to understand and control circuit stray elements, especially parasitic inductances, and current distributions.es_ES
dc.description.sponsorshipThis work has been supported by the Department of Education, Universities and Research of the Basque Country within the fund for research groups IT978-16 and the research program ELKARTEK as the project KT4TRANS (KK-2015/00047 and KK-2016/0006l). The support of the Ministerio de Economía y Competitividad of Spain within the project DP12014-53685-C2-2-R and FEDER funds. As well as, the program to support the education of researches of the Basque Country PRE_2016_2_0086 and technical and human support provided by IZO-SGI SGIker of UPV/EHU and European funding (ERDF and ESF).es_ES
dc.language.isoenges_ES
dc.publisherIEEEes_ES
dc.relationinfo:eu-repo/grantAgreement/MINECO/DP12014-53685-C2-2-Res_ES
dc.rightsinfo:eu-repo/semantics/restrictedAccesses_ES
dc.subjectparallelizationes_ES
dc.subjectlayoutes_ES
dc.subjectparasitic inductance (Lp)es_ES
dc.subjectcurrent distributiones_ES
dc.subjectcoupling parasitic effect (Mp)es_ES
dc.subjectsimulationes_ES
dc.subjectEM modeles_ES
dc.subjectADS TMes_ES
dc.subjectnon ideal effectses_ES
dc.titleAnalysis of impedance and current distributions in parallel IGBT designes_ES
dc.typeinfo:eu-repo/semantics/conferenceObjectes_ES
dc.rights.holder© 2017 IEEEes_ES
dc.relation.publisherversionhttps://ieeexplore.ieee.org/document/8001317es_ES
dc.identifier.doi10.1109/ISIE.2017.8001317
dc.departamentoesTecnología electrónicaes_ES
dc.departamentoeuTeknologia elektronikoaes_ES


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