dc.contributor.author | Matallana Fernandez, Asier | |
dc.contributor.author | Andreu Larrañaga, Jon | |
dc.contributor.author | Gárate Añibarro, José Ignacio | |
dc.contributor.author | Martínez de Alegría Mancisidor, Iñigo | |
dc.contributor.author | Kortabarria Iparragirre, Iñigo | |
dc.date.accessioned | 2024-04-29T17:41:44Z | |
dc.date.available | 2024-04-29T17:41:44Z | |
dc.date.issued | 2017-08-07 | |
dc.identifier.citation | IEEE 26th International Symposium on Industrial Electronics (ISIE), Edinburgh, UK, 2017 : 616-621 (2017) | es_ES |
dc.identifier.isbn | 978-1-5090-1412-5 | |
dc.identifier.issn | 2163-5145 | |
dc.identifier.uri | http://hdl.handle.net/10810/66926 | |
dc.description.abstract | Power electronic applications need high voltage and current ranges which are impossible to obtain with discrete devices. Parallelization technique is a solution to increase power converter current capacity. Current distribution problems may reduce device lifetime and cause converter malfunction. Parallelization requires a total control of circuit parasitic elements which depend on layout physical materials and dimensions. The objective of this article is to show, by electromagnetic (EM) model simulations, layout non ideal effects for power circuits, in order to understand and control circuit stray elements, especially parasitic inductances, and current distributions. | es_ES |
dc.description.sponsorship | This work has been supported by the Department of Education, Universities and Research of the Basque Country within the fund for research groups IT978-16 and the research program ELKARTEK as the project KT4TRANS (KK-2015/00047 and KK-2016/0006l). The support of the Ministerio de Economía y Competitividad of Spain within the project DP12014-53685-C2-2-R and FEDER funds. As well as, the program to support the education of researches of the Basque Country PRE_2016_2_0086 and technical and human support provided by IZO-SGI SGIker of UPV/EHU and European funding (ERDF and ESF). | es_ES |
dc.language.iso | eng | es_ES |
dc.publisher | IEEE | es_ES |
dc.relation | info:eu-repo/grantAgreement/MINECO/DP12014-53685-C2-2-R | es_ES |
dc.rights | info:eu-repo/semantics/restrictedAccess | es_ES |
dc.subject | parallelization | es_ES |
dc.subject | layout | es_ES |
dc.subject | parasitic inductance (Lp) | es_ES |
dc.subject | current distribution | es_ES |
dc.subject | coupling parasitic effect (Mp) | es_ES |
dc.subject | simulation | es_ES |
dc.subject | EM model | es_ES |
dc.subject | ADS TM | es_ES |
dc.subject | non ideal effects | es_ES |
dc.title | Analysis of impedance and current distributions in parallel IGBT design | es_ES |
dc.type | info:eu-repo/semantics/conferenceObject | es_ES |
dc.rights.holder | © 2017 IEEE | es_ES |
dc.relation.publisherversion | https://ieeexplore.ieee.org/document/8001317 | es_ES |
dc.identifier.doi | 10.1109/ISIE.2017.8001317 | |
dc.departamentoes | Tecnología electrónica | es_ES |
dc.departamentoeu | Teknologia elektronikoa | es_ES |